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Single event effect proton and heavy ions test results for Ethernet local area network commercial devices

机译：以太网局域网商用设备的单事件效应质子和重离子测试结果

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摘要

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft commercial electronics. Device types are IEEE802.3 (ETHERNET) Local Area Network (LAN) controllers, repeaters and transceivers.

机译：我们提供了候选航天器商业电子的质子和重离子单事件效应（SEE）地面测试结果。设备类型为IEEE802.3（ETHERNET）局域网（LAN）控制器，转发器和收发器。

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《》|1996年|P.73-77|共5页
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Poivey; C.; Garnier; P.;
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中图分类无线电电子学、电信技术;
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3. High-energy heavy ion testing of VLSI devices for single event upsets and latch up [J] . S B UMESH, S R KULKARNI, R SANDHYA Bulletin of Materials Science . 2005,第5期

机译：VLSI器件的高能重离子测试，用于单事件触发和闩锁
4. Single event effect proton and heavy ions test results for Ethernet local area network commercial devices [C] . Poivey C., Garnier P., Institute of Electric and Electronic Engineer IEEE Radiation Effects Data Workshop . 1996

机译：单事件效果质子和重离子以太网局域网商业设备的测试结果
5. Energy deposition mechanisms for proton- and neutron-induced single event upsets in modern electronic devices. [D] . Clemens, Michael Andrew. 2012

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8. Heavy Ion Induced Single Event Phenomena (SEP) Data for Semiconductor Devices from Engineering Testing [R] . Nichols, D. K., Huebner, M. A., Price, W. E., 1988

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Single event effect proton and heavy ions test results for Ethernet local area network commercial devices

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