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Scattering analysis of multi-layered dielectric bodies of revolution-iterative method

机译:旋转迭代法多层介电体的散射分析

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For the EM problem of multi-layered dielectric bodies, the amounts of computer storage and computation time, which are required for moment method solution, is prohibitive. However, when the scatterer is rotationally symmetric, the amounts of computer storage and computation time can be considerably reduced. The EM scattering from a BOR (body of revolution) has been extensively studied by many researchers. Also, the exact solutions for the EM scattering problem of multi-layered dielectric spheres have been developed. On the other hand, the fictitious current model (FCM) has been applied to various EM scattering problems. Also this model has been successfully applied to the scattering problem of a conducting BOR (Hyung-Gi Na and Hyo-Tae Kim). Since in this method, both current sources and boundary condition testing are of point-form, the numerical procedure is simple and fast. In the present paper, the method of Hyung-Gi Na and Hyo-Tae Kim is extended to the EM scattering problem of multi-layered dielectric BORs. The boundary of each layer is assumed to be symmetric about its axis of rotation. However, the whole scatterer is not necessarily axisymmetric since the axes of rotation may be different from each other. Thus, in order to take advantage of the symmetry of each layer, the EM scattering of each layer is solved separately. After the EM problem is solved in the p-th boundary, the effects of the scattered field are added to neighboring boundaries. This procedure is repeated for every layer until the desired degree of accuracy is obtained.
机译:对于多层介电体的EM问题,矩量法求解所需的计算机存储量和计算时间令人望而却步。但是,当散射体旋转对称时,可以大大减少计算机的存储量和计算时间。许多研究人员已经广泛研究了BOR(旋转体)产生的EM散射。而且,已经开发出用于多层介电球的EM散射问题的精确解决方案。另一方面,虚拟电流模型(FCM)已应用于各种EM散射问题。此模型也已成功地应用于传导BOR的散射问题(Hyung-Gi Na和Hyo-Tae Kim)。由于在这种方法中,电流源和边界条件测试都是点形式的,因此数值过程简单而快速。本文将Hyung-Gi Na和Hyo-Tae Kim的方法扩展到多层电介质BORs的EM散射问题。假定每个层的边界关于其旋转轴对称。但是,整个散射体不一定是轴对称的,因为旋转轴可能彼此不同。因此,为了利用每一层的对称性,分别解决每一层的EM散射。在第p个边界中解决了EM问题之后,将散射场的影响添加到了相邻边界中。对每一层都重复此过程,直到获得所需的精度。

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