首页> 外文会议> >An advanced CMOS EPROM technology for high speed/high density programmable logic devices and memory applications
【24h】

An advanced CMOS EPROM technology for high speed/high density programmable logic devices and memory applications

机译:用于高速/高密度可编程逻辑器件和存储器应用的先进CMOS EPROM技术

获取原文
获取外文期刊封面目录资料

摘要

A 0.65 /spl mu/m double-level poly and metal UV EPROM CMOS technology has been developed for high speed complex Programmable Logic Device (PLD) and memory applications. Six types of transistors are used for the high performance designs. In addition to the design rule scaling, the new process includes poly buffer LOCOS (PBL) isolation, borderless contacts/vias. Half the die size and twice the speed on a high density MAX product has been demonstrated compared to a 0.8 /spl mu/m technology.
机译:已开发出0.65 / spl mu / m的双层多晶硅和金属UV EPROM CMOS技术,用于高速复杂的可编程逻辑器件(PLD)和存储器应用。六种类型的晶体管用于高性能设计。除了设计规则缩放外,新过程还包括多缓冲区LOCOS(PBL)隔离,无边界触点/通孔。与0.8 / spl mu / m的技术相比,已经证明了高密度MAX产品的管芯尺寸是其一半,速度是其两倍。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号