首页> 外文会议> >Limiting the effects of radiation damage in charge-coupled devices by control of operating conditions
【24h】

Limiting the effects of radiation damage in charge-coupled devices by control of operating conditions

机译:通过控制工作条件来限制电荷耦合器件中辐射损坏的影响

获取原文

摘要

Particle irradiation tests and theoretical prediction programmes, mounted as part of the European Space Agency's TRP project, show the way in which damage in EEV scientific CCDs increases with time in space. Radiation damage levels expected with the passage of time in various orbits can be estimated using test results backed by prediction techniques. The authors describe these techniques and outline engineering measures to harden the system, by trading off such parameters as orbit altitude, chip temperature and shield weight.
机译:作为欧洲航天局的TRP项目的一部分,粒子辐照测试和理论预测计划表明了EEV科学CCD在空间中的时间增加的方式。可以使用预测技术支持的测试结果估计随着时间的推移,预期的辐射损伤水平预期。作者描述了这些技术和轮廓工程措施,以通过交易轨道高度,芯片温度和屏蔽重量来交易此类参数来硬化系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号