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SURFACE PLASMON ASSISTED LASER NANOLITHOGRAPHY USING METALIC MASK

机译:表面等离子体辅助金属掩模的激光纳米照相术

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摘要

Traditional photolithography has a resolution at wavelength scale due to optical diffraction. In this paper, a high-density direct photolithography method beyond diffraction limit by utilizing surface plasmons (SPs) was developed on virtually any substrate. Simulation results by Finite Different Time Domain (FDTD) method have shown that surface plasmon excited on both the mask and the substrate helps to confine the light behind the apertures of the mask. Numerical simulations have demonstrated that very high density sub-wavelength patterns can be transferred using this method. In experiments, a polarized laser beam of 355nm wavelength was used as a light source to photo-initiate a 80nm-thick photoresist on a silicon substrate with 50nm Ti coating. 100nm line aperture patterns were made on gold film on quartz substrate as mask. Experimental results showed that illumination intensity control is crucial to the lithography results. The feature size using such method could be further scaled down, limited theoretically by the validity of dielectric function of the material, and practically by the fabrication of mask.
机译:由于光学衍射,传统的光刻技术在波长范围内具有分辨率。在本文中,实际上在任何基板上都开发了一种通过利用表面等离子体激元(SP)超越衍射极限的高密度直接光刻技术。有限时域有限差分法(FDTD)的仿真结果表明,在掩模和基板上激发的表面等离子体激元有助于将光限制在掩模的孔后面。数值模拟表明,使用此方法可以传输非常高密度的亚波长模式。在实验中,将355nm波长的偏振激光束用作光源,以在具有50nm Ti涂层的硅基板上光引发80nm厚的光刻胶。在石英基板上的金膜上作为掩模制作100nm的线孔图案。实验结果表明,照明强度控制对光刻结果至关重要。使用这种方法的特征尺寸可以进一步缩小,理论上受材料介电功能有效性的限制,而实际上受掩模制造的限制。

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