首页> 外文会议>Materials and contact characterisation VIII >THE DEPENDENCE OF REVERSE RECOVERY TIME ON BARRIER CAPACITANCE AND SERIES-ON RESISTANCE IN SCHOTTKY DIODES
【24h】

THE DEPENDENCE OF REVERSE RECOVERY TIME ON BARRIER CAPACITANCE AND SERIES-ON RESISTANCE IN SCHOTTKY DIODES

机译:肖特基二极管的反向恢复时间与栅栏电容和级联电阻的相关性

获取原文
获取原文并翻译 | 示例

摘要

It is well known that reverse recovery time (trr) is important when a diode is used in a switching application. It is the time taken to switch the diode from its forward conducting or 'ON' state to the reverse "OFF' state. As a result, there is reverse current overshoot when switching from the forward conducting state to the reverse blocking state. The time is needed to remove the reverse recovery charge (Qrr) as a Schottky diode is normally measured in nanoseconds, ns. Some diodes exhibit trrS of lOOp/s. The experimental part consists of the measurements of the reverse recovery time on a special tester - LEMSYS DMS dynamic parameter system - the SiC Schottky diodes C3D10060A are used. In the present work, measuring the results of reverse recovery time depends on additional resistors and condensers connected to the initial diode. It has been shown that the recovery time is mostly determined by the barrier capacitance, and should not depend on the resistance of the base.
机译:众所周知,当在开关应用中使用二极管时,反向恢复时间(trr)很重要。这是将二极管从其正向导通或“ ON”状态切换到反向“ OFF”状态所花费的时间,因此,从正向导通状态切换到反向阻断状态时会产生反向电流过冲。肖特基二极管通常以纳秒(ns)为单位进行测量,因此需要去除反向恢复电荷(Qrr),某些二极管的trrS为100p / s,实验部分包括在专用测试仪LEMSYS上测量反向恢复时间DMS动态参数系统-使用SiC肖特基二极管C3D10060A。在当前工作中,测量反向恢复时间的结果取决于连接到初始二极管的附加电阻器和电容器,这表明恢复时间主要取决于势垒电容,不应依赖于基极的电阻。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号