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FACTORISATION OF A CERTAIN WIENER-HOPF MATRIX ARISING IN DIFFRACTION THEORY

机译:衍射理论中某些维纳-霍夫矩阵的分解

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Ultrasonic inspection is a widely used method for determining the existence of defects in components. It relies on specular reflection and diffraction of elastic waves at crack faces and edges to locate and size possible defects. The redistribution of energy into a range of diffracted angles is a purely local phenomenon and is determined by the properties of the material at the crack tip and its shape. As all materials are naturally anisotropic, it is clearly necessary to understand how diffraction is modified by anisotropy. An understanding of the effects of anisotropy could therefore help to optimise inspection techniques and justify procedures for detecting and sizing crack-like defects. The quantity of interest is the diffraction coefficient, which relates the vector amplitude of a ray incident on a crack edge to the amplitudes of the diffracted rays. The geometrical theory of diffraction (GTD) is the most useful approach for determining diffraction coefficients. However using GTD it is not possible to consider arbitrary angles of incidence, on arbitrarily oriented defects in materials with low degrees of symmetry. The only previously known results for diffraction coefficients are where there is a high degree of symmetry in the material. These include the three dimensional isotropic case and the two dimensional transversely isotropic problem, considered in [3]. Temple and White attempted to determine diffraction coefficients in more general materials numerically using time dependent finite difference simulations, with limited success.
机译:超声波检查是一种广泛使用的方法,用于确定组件中是否存在缺陷。它依靠裂纹面和边缘的弹性波的镜面反射和衍射来定位和确定可能的缺陷的大小。将能量重新分配到一定范围的衍射角中是纯粹的局部现象,并且由裂纹尖端处的材料特性及其形状确定。由于所有材料都是自然各向异性的,因此显然有必要了解各向异性如何改变衍射。因此,对各向异性的影响的理解可以帮助优化检查技术,并为检测和确定裂纹状缺陷的大小确定合理的程序。感兴趣的量是衍射系数,其将入射在裂纹边缘的光线的矢量振幅与衍射光线的振幅相关联。衍射几何理论(GTD)是确定衍射系数最有用的方法。但是,使用GTD不可能在低对称度的材料中任意取向的缺陷上考虑任意入射角。衍射系数的先前唯一已知的结果是材料中高度对称的位置。这些包括在[3]中考虑的三维各向同性情况和二维横向各向同性问题。 Temple和White尝试使用时间相关的有限差分模拟在数值上确定更一般的材料中的衍射系数,但效果有限。

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