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Thermal conductivity manipulation in lithographically patterned single crystal silicon phononic crystal structures

机译:光刻图案化的单晶硅声子晶体结构中的热导率控制

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The thermal conductivity of single crystal silicon was engineered using lithographically formed phononic crystals. Specifically, sub-micron periodic through-holes were patterned in 500nm-thick silicon membranes to construct phononic crystals, and through phonon scattering enhancement, heat transfer was significantly reduced. The thermal conductivity of silicon phononic crystals was measured as low as 32.6W/mK, which is a ∼75% reduction compared to bulk silicon thermal conductivity [1]. This corresponds to a 37% reduction even after taking into account the contributions of the thin-film and volume reduction effects, while the electrical conductivity was reduced only by as much as the volume reduction effect. The demonstrated method uses conventional lithography-based technologies that are directly applicable to diverse micro/nano-scale devices, leading toward huge performance improvements where heat management is important.
机译:使用光刻形成的声子晶体来设计单晶硅的导热率。具体而言,在500nm厚的硅膜上对亚微米周期性通孔进行构图,以构造声子晶体,并且通过声子散射增强,传热显着降低。测得的硅声子晶体的热导率低至32.6W / mK,与整体硅的热导率相比降低了约75%[1]。即使考虑到薄膜的贡献和体积减小效应,这也相当于减少了37%,而电导率仅减小了体积减小效应。演示的方法使用了直接基于光刻技术的传统技术,这些技术可直接应用于各种微/纳米级设备,从而在热管理很重要的情况下实现了巨大的性能提升。

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