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PREPARATION OF HARD CARBON FILMS BY MCECR PLASMA SPUTTERING METHOD

机译:MCECR等离子溅射法制备硬质碳膜

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摘要

Experimental study to obtain high quality hard carbon films were conducted using a Mirror-Confinement-type Electron Cyclotron Resonance (MCECR) plasma sputtering method. The films with 40nm thickness were deposited onto silicon(100) substrates by sputtering the sintered carbon target with the argon plasma. The bonding structure of the film was analyzed by using the x-ray photoelectron spectropscopy(XPS) and the nanostructure was evaluated with the high-resolution transmission electron microscopy(HRTEM). The effect of argon ion irradiation energy controlled by the substrate bias on the nanostructure and the tribological properties (friction coefficient, wear rate, nanohardness) of the film was investigated. The tribological properties were measured by using a Pin-on-Disk tribometer under the conditions that the normal load was 1N and the sliding velocity was 0.05m/s. The nanohardness of the films was measured by using the triboscope under conditions that the maximum displacement was 30nm and the maximum load was 500μN.
机译:使用镜限制型电子回旋共振(MCECR)等离子体溅射方法进行了获得高质量硬质碳膜的实验研究。通过用氩等离子体溅射烧结的碳靶,将厚度为40nm的薄膜沉积到硅(100)衬底上。用X射线光电子能谱法(XPS)分析了薄膜的键合结构,并用高分辨率透射电子显微镜(HRTEM)评价了纳米结构。研究了受衬底偏压控制的氩离子辐照能量对薄膜纳米结构和摩擦学性能(摩擦系数,磨损率,纳米硬度)的影响。在正常载荷为1N,滑动速度为0.05m / s的条件下,使用盘式摩擦计测量摩擦性能。在最大位移为30nm,最大载荷为500μN的条件下,使用摩擦镜测量膜的纳米硬度。

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