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Integrated CMOS-MEMS Technology and Its Applications

机译:集成CMOS-MEMS技术及其应用

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摘要

The paper reports a feature and techniques to resolve requirements of integrated CMOS-MEMS technology. The multi-physics simulation platform for this technology has been developed to understand simultaneously both the mechanical and electrical behaviors of MEMS stacked on LSI. An equivalent circuit of a MEMS accelerometer has been developed with an electrical circuit simulator. We review the technology for CMOS-MEMS accelerometer with a wide detection range. Using the simulation platform above, we investigated the capacitive CMOS-MEMS sensor to a MEMS accelerometer implemented by the post-CMOS process onto CMOS circuit. As a result, it is confirmed that integrated CMOS-MEMS technology will shed light on a solution of More than Moore technical trends.
机译:该论文报告了解决集成CMOS-MEMS技术要求的功能和技术。已开发出用于该技术的多物理场仿真平台,以同时了解堆叠在LSI上的MEMS的机械和电气性能。 MEMS加速度计的等效电路已经用电路仿真器开发。我们回顾了具有广泛检测范围的CMOS-MEMS加速度计技术。使用上面的仿真平台,我们研究了通过CMOS电路上的后CMOS工艺实现的MEMS加速度计的电容式CMOS-MEMS传感器。结果,可以肯定的是,集成CMOS-MEMS技术将为Moore技术趋势解决方案提供启发。

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  • 会议地点 Orlando FL(US)
  • 作者单位

    NTT Advanced Technology Corp. 3-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0124, Japan,Tokyo Institute of Technology 4259 Nagatsuta, Midori-ku, Yokohama, Kanagawa 226-8503, Japan;

    NTT Advanced Technology Corp. 3-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0124, Japan;

    Tokyo Institute of Technology 4259 Nagatsuta, Midori-ku, Yokohama, Kanagawa 226-8503, Japan;

    RCAST, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan;

    Tokyo Institute of Technology 4259 Nagatsuta, Midori-ku, Yokohama, Kanagawa 226-8503, Japan;

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  • 正文语种 eng
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