The research on vertical block mura in TFT-LCD

摘要

In the Thin Film Transistor-Liquid Crystal Display (TFT-LCD) array process, mura is one type of usual defects, which directly affects image quality and production yield. In this paper, a vertical block mura, which massively occurred in the LCD products, was investigated and analyzed extensively by various methods, source drain (SD) line pattern shift is found out to be one of the key reasons generating vertical block mura This work to some extent, establishes theoretic hypothesis for further research and provides solutions to similar issues in the future.