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Electronic properties of grown-in defects in semi-insulating GaAs

机译:半绝缘GaAs中缺陷的电子性质

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Abstract: Defect structure of semi-insulating GaAs substrates manufactured by various vendors were compared using High Resolution Photo-Induced Transient Spectroscopy. A number of defect centers related to native defects and metallic impurities were detected and the concentrations of these centers were estimated.!14
机译:摘要:使用高分辨率光诱导瞬态光谱法比较了不同供应商生产的半绝缘GaAs衬底的缺陷结构。检测到许多与天然缺陷和金属杂质有关的缺陷中心,并估计了这些中心的浓度!14

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