首页> 外文会议>International Conference of the European Society for Precision Engineering and Nanotechnology vol.1; 20050508-11; Montpellier(FR) >Development of a universal calibration device for the depth measuring system in a nanoindentation instrument
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Development of a universal calibration device for the depth measuring system in a nanoindentation instrument

机译:开发用于纳米压痕仪深度测量系统的通用校准设备

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In this investigation a combination of a differential interferometer and a confocal probe is proposed in order to measure small displacements of an object with large curvature. The arrangement avoids the disadvantages of a traditional interferometer application for the calibration of the depth measuring system in a nanoin dentation instrument. An experimental prototype based on the proposed interferometer was built. The first investigation results prove that the new interferometer can be successfully applied for the task to calibrate the depth measuring system of a nanoindentation instrument.
机译:在这项研究中,提出了差分干涉仪和共焦探头的组合,以测量具有大曲率的物体的小位移。该布置避免了用于纳米压痕仪中的深度测量系统的校准的传统干涉仪应用的缺点。建立了基于所提出的干涉仪的实验原型。初步研究结果证明,该新型干涉仪可以成功地用于校准纳米压痕仪深度测量系统的任务。

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