A Built-in Current Monitor Design for Transient Current Testing

摘要

An on-chip transient current monitor to detect transient current in chips is proposed. This current monitor is tested for a wide range of reference currents from 3 礎 to 10 mA and for different pulsewidths using TSMC 0.18?technology. A method to dynamically vary the reference current is also presented. The current monitor is tested on varieties of Circuit Under Test (CUT) blocks and results are presented.