提高通用IC测试系统瞬态大电流测试可靠性的研究

摘要

Parameter test of transient high current is actually testing the duration time of MOSFET short-circuit current of bridge driver IC. Present test methods cannot realize the reliable all parameters tests on the basis of IC test system. Given this, a attempt is done to solve the transient high current testing results reliability problem based on present IC test system as a platform, especially relying on domestic IC test system to realize IC automated and all parameter testing ,and finally to enhance the accuracy and re-liability of IC test results.%对瞬态大电流的参数进行测试,实质上就是测试桥式驱动集成电路的MOSFET短路电流持续时间.现有的测试手段无法在IC测试系统上实现可靠的全参数测试.鉴于此,以现有的IC测试系统为平台,特别是依托国产IC测试系统,尝试解决瞬态大电流参数测试结果的可靠性问题,实现桥式驱动集成电路自动化、全参数的测试,最终提高集成电路测试结果的准确性和可靠性.