Chemical force microscopies by friction and adhesion using chemically modified atomic force microscope (AFM) tips

摘要

Dependence of friction and adhesion on surface chemical species on samples has been studied by friction force microscopy and pulsed-force-mode (PFM) AFM, respectively, using chemically modified atomic force microscope (AFM) tips. We concentrated on ?) how to modify gold coated AFM tips reproducibly with thiol compounds, ⅱ) examination of chemical recognition of Si(100) surfaces partially covered with hydrocarbon monolayer domains using the modified tips, and ⅲ) dependence of friction and adhesion on composition of phase-separated domains in mixed hydrocarbon and fluorocarbon Langmuir-Blodgett films. These films were also studied with scanning surface potential microscopy, which provides information on permanent dipole moments of the terminal groups. Chemical force microscopy of self-assembeld monolayers prepared by microcontact printing was also studied by PFM-AFM.