Nanoscale imaging of CaCu_3Ti_4O_(12) dielectric properties: the role of surface defects

摘要

Scanning probe microscopy with conductive tips has been used to image the dielectric properties of ceramics with giant permittivity. In particular, measurements in impedance mode and of local resistivity allowed to image the permittivity map on polycrystalline materials. Such imaging allows to correlate the dielectric properties with the local sample structure and with defects inside the single grains of the polycrystalline ceramics. However, artifacts due to surface imperfections should be distinguished from bulk properties and eliminated.