Challenges and Approaches to Radiation Hardness Control of Electronic Components to In-Space High-Energy Particles Exposure

摘要

One of the very important challenges for space system engineers is to ensure the radiation tolerance of electronic components and spacecraft equipment to space radiation environment. For modern semiconductor devices single event effects induced by high-energy particles emitted from the Sun and galactic cosmic rays are the most critical, since they limit the active lifetime of spacecrafts. To be sure that the spacecraft equipment will operate properly during the space mission, the ground single event effect tests shall be performed. For this purpose heavy-ion, proton and laser facilities are used. In this paper we will overview the test facilities available in Russia, which provide carrying out single event effect tests. Admissible methods and typical approaches to single event effect test procedures will be discussed.