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Influence of substrate temperature and thermal treatment on sputtered ZnO:B using B2H6 as doping source

机译:B2H6掺杂对衬底温度和热处理工艺对溅射ZnO:B的影响

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In the present study,boron doped zinc oxide (ZnO:B) films deposited by RF magnetron sputtering using an undoped ZnO ceramic target were prepared.Diborane (B2H6) was introduced into sputtering atmosphere as doping source.Substrate temperature was varied from 50 to 200 oC in order to adjust crystalline quality.The resistivity increased from 1.5×10.3Ωcm to 8.4×10.3Ωcm as temperature rising above 70℃.Carrier concentration dropped from 2.3×1020cm.3 to 7.8×1019cm.3 while mobility dropped from 18.9cm2/Vs to 7.1cm2/Vs.This indicated that the substrate temperature plays an important role on the doping efficiency of B2H6 in gas source magnetron sputtering growth of conductive ZnO:B films.Under the optimal deposition temperature (about 70 ℃ in our system),ZnO:B film with low resistivity (1.5х10-3 Ωcm) and high transparency (average transparency from 400 nm to 1300 nm was over 87%) was obtained.After thermal treatment,the resistivity decreased to 8.6 ×10.4Ω·cm,with mobility increased to 28.4 cm2/Vs.
机译:本研究制备了使用未掺杂的ZnO陶瓷靶通过RF磁控溅射沉积的硼掺杂氧化锌(ZnO:B)薄膜,将乙硼烷(B2H6)引入溅射气氛作为掺杂源,衬底温度在50至200之间变化oC是为了调节晶体质量。随着温度升高到70℃以上,电阻率从1.5×10.3Ωcm增加到8.4×10.3Ωcm。载流子浓度从2.3×1020cm.3下降到7.8×1019cm.3,迁移率从18.9cm2 /下降Vs到7.1cm2 / Vs。这表明衬底温度对B2H6在导电ZnO:B膜的气源磁控溅射生长中的掺杂效率起着重要作用。在最佳沉积温度下(在我们的系统中约为70℃),获得了低电阻率(1.5х10-3Ωcm)和高透明性(400 nm至1300 nm的平均透明度超过87%)的ZnO:B薄膜。热处理后,电阻率降至8.6×10.4Ω·cm,迁移率增加到28.4 cm2 / V s。

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