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A 2TnC ferroelectric memory gain cell suitable for compute-in-memory and neuromorphic application

机译:适用于内存中计算和神经形态应用的2TnC铁电存储器增益单元

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A 2TnC ferroelectric memory gain cell consisting of two transistors and two or more ferroelectric capacitors (FeCAP) is proposed. While a pre-charge transistor allows to access the single cell in an array, the read transistor amplifies the small read signals from small-scaled FeCAPs that can be operated either in FeRAM mode by sensing the polarization reversal current, or in ferroelectric tunnel junction (FTJ) mode by sensing the polarization dependent leakage current. The simultaneous read or write operation of multiple FeCAPs is used to realize compute-in-memory (CiM) algorithms that enable processing of data being represented by both, non-volatilely internally stored data and externally applied data. The internal gain of the cell mitigates the need for 3D integration of the FeCAPs, thus making the concept very attractive especially for embedded memories. Here we discuss design constraints of the 2TnC cell and present the proof-of-concept for realizing versatile (CiM) approaches by means of electrical characterization results.
机译:提出了一种由两个晶体管和两个或多个铁电电容器(FeCAP)组成的2TnC铁电存储增益单元。尽管预充电晶体管允许访问阵列中的单个单元,但读取晶体管会放大来自小规模FeCAP的小读取信号,这些小FeFes可以通过检测极化反转电流以FeRAM模式或铁电隧道结( FTJ)模式通过感测极化相关的泄漏电流。多个FeCAP的同时读取或写入操作用于实现内存计算(CiM)算法,该算法能够处理由非易失性内部存储的数据和外部应用的数据表示的数据。单元的内部增益减轻了对FeCAP进行3D集成的需要,因此使该概念特别具有吸引力,特别是对于嵌入式存储器。在这里,我们讨论2TnC电池的设计约束条件,并提出通过电表征结果实现通用(CiM)方法的概念验证。

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