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THz emission from Ge/Si nanoostructure

机译:Ge / Si纳米结构的THz发射

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摘要

We report both the electrical and emission measurement on novel structure of Ge/Siquantum dots. Strong radiation is observed in the terahertz (THz) ranging between 60to 140 mm. Theoretical modeling on the energy level of the islands, taking intoaccount of Ge/Si intermixing and strain relaxation, was performed. It shows that, theenergy separation of confined levels of heavy-light holes band are smaller than theoptical phonon energy for a strain less then 20±10%. From the analysis, we concludethat the observed emission was originated from the islands.
机译:我们报告了Ge / Siquantum点的新型结构的电学测量和发射测量。在60至140毫米的太赫兹(THz)中观察到强辐射。考虑到锗/硅的混合和应变弛豫,对岛的能级进行了理论建模。结果表明,在小于20±10%的应变范围内,重光空穴带的有限能级的能级分离小于光子声子能级。通过分析,我们得出结论,观测到的排放源于岛屿。

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