A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms

摘要

We propose and theoretically validate a novel demultiplexer capable to automatically correct all fabrication-error-induced spectrum impairments. This technology, once realized, enables high-channel-count (> 64 ch) dense WDM systems on low-end Si PIC platforms.