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Investigation of DX Center Effect on 2DEG Density in Si δ-Doped Al_xGa_(1-x)As/GaAs Heterostructure

机译:Siδ掺杂Al_xGa_(1-x)As / GaAs异质结构中DX中心效应对2DEG密度的影响

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The DX centers effect on the electron gas density in δ-doped AlGaAs/GaAs heterostructure is analyzed using a quantum model based on a Self-Consistent solution of Poisson and Schrodinger equations. A DX center model is considered assuming Fermi-Dirac statistics with Aluminum mole fraction dependence of the deep-donor energy level. The results reveal that a decrease in the sheet electron density is caused by the presence of DX center. Furthermore, the pseudomorophic AlGaAs/InGaAs/GaAs heterostructure is also investigated in the DX center model. The Control Volume Method is used to discretize the governing equations.
机译:使用基于泊松方程和薛定inger方程的自洽解的量子模型分析了DX中心对δ掺杂AlGaAs / GaAs异质结构中电子气密度的影响。考虑DX中心模型,假设其Fermi-Dirac统计与深施主能级的铝摩尔分数相关。结果表明,片状电子密度的降低是由DX中心的存在引起的。此外,还在DX中心模型中研究了假晶AlGaAs / InGaAs / GaAs异质结构。控制体积法用于离散控制方程。

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