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The gettering effect of dielectric films for silicon solar cells

机译:硅太阳能电池用介电膜的吸杂作用

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We present our recent findings on the strong gettering effect of dielectric films for removing impurities from the silicon bulk. Iron was used as a model impurity in silicon to study the gettering effects. The iron concentration in silicon is found to be significantly reduced after annealing silicon wafers coated with either plasma-enhanced chemical vapour deposited (PECVD) silicon nitride (SiN
机译:我们介绍了我们最近的发现,即电介质膜具有很强的吸杂作用,可从硅块中去除杂质。铁用作硅中的模型杂质以研究吸杂效果。在对涂有等离子增强化学气相沉积(PECVD)氮化硅(SiN)的硅晶片进行退火处理后,发现硅中的铁浓度显着降低

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