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Effects of Gallium Nitride (GaN) Cascode FETs on the Efficiency of an Interleaved DC-DC Converter

机译:氮化镓(GaN)共源共栅FET对交错式DC-DC转换器效率的影响

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摘要

Increasing global demand for renewable energy systems is necessitating the application of high-efficiency power conversion. Wide-band gap (WBG) semiconductor devices such as gallium nitride (GaN) are increasing semiconductor switching performance and exceeding the limitations of current silicon (Si) devices. This paper presents a performance comparison between GaN cascode FET and Si CoolMOS power devices in an interleaved dc-dc boost converter. Switching characteristics and energy losses are measured through a double-pulse test (DPT) and analyzed at various voltages and junction temperatures. The effects of integrating GaN power devices in the converter are examined at higher switching frequencies and output power levels. The resulting total power loss and overall efficiency of the two converters are compared. The GaN power device in the converter offers better performance, lower switching loss, and more energy efficiency than the conventional interleaved boost converter with Si devices.
机译:全球对可再生能源系统的需求不断增长,因此有必要应用高效功率转换。诸如氮化镓(GaN)之类的宽带隙(WBG)半导体器件正在提高半导体开关性能,并超出了当前硅(Si)器件的限制。本文介绍了交错式DC-DC升压转换器中GaN级联FET和Si CoolMOS功率器件之间的性能比较。开关特性和能量损耗通过双脉冲测试(DPT)进行测量,并在各种电压和结温下进行分析。在更高的开关频率和输出功率水平下,要检查将GaN功率器件集成到转换器中的效果。比较了两个转换器产生的总功率损耗和整体效率。与传统的带Si器件的交错式升压转换器相比,该转换器中的GaN功率器件具有更好的性能,更低的开关损耗和更高的能源效率。

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