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System of Designing Test Programs and Modeling of the Memory Microcircuits

机译:存储器微电路测试程序设计和建模系统

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摘要

There are suggested the high-performance memory device fault-detection automated test design techniques and measures. Simulation models allowing to save project operations labor have been designed by the algorithms and testing programs the object's and testing device's. The designed program model of memory device and diagnostic tools can be used in universities and scientific-production associations for developing new diagnostic systems.
机译:提出了高性能存储设备故障检测自动测试设计技术和措施。通过算法和对象和测试设备的测试程序设计了可以节省项目操作人工的仿真模型。设计的存储设备程序模型和诊断工具可用于大学和科学生产协会,以开发新的诊断系统。

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