Evaluation of the Operation for the Shift Register Circuit Implemented by Low Temperature Poly-Si Thin-Film Transistors

摘要

In this paper, the LTPS TFT shift register circuit is simulated with Monte Carlo method to evaluate the effects due to the non-uniformity in the LTPS TFT characteristics. A computationally efficient method has been presented for the estimation of the power distribution and the yield in the presence of device variations.