IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany ,Joint Lab IHP/BTU, Konrad-Wachsmann-Allee 1, 03046 Cottbus, Germany,V.A. Fok Institute of Physics, St.-Petersburg State University, Ulyanovskaya 1, 198504 St. Petersburg, Russia;
V.A. Fok Institute of Physics, St.-Petersburg State University, Ulyanovskaya 1, 198504 St. Petersburg, Russia;
IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany ,Joint Lab IHP/BTU, Konrad-Wachsmann-Allee 1, 03046 Cottbus, Germany;
Joint Lab IHP/BTU, Konrad-Wachsmann-Allee 1, 03046 Cottbus, Germany;
BESSY, Albert-Einstein-Str. 15, 12489 Berlin, Germany;
IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany ,Joint Lab IHP/BTU, Konrad-Wachsmann-Allee 1, 03046 Cottbus, Germany;
multycristalline silicon; X-ray beam induced current (XBIC); X-ray fluorescence (XRF); X-ray excited optical luminescence microscopy (μ-SXEOL);
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