Soft x-ray and EUV efficiencies of CCDs

机译：CCD的软X射线和EUV效率

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Abstract: We present a compilation of CCD quantum efficiency measurements made at soft x-ray and extreme ultraviolet wavelengths. The measurements include CCDs of varying architecture and have been obtained from a number of projects over the last several years.!5

机译：摘要：我们提出了在软X射线和极端紫外线波长下进行的CCD量子效率测量的汇编。这些测量包括不同架构的CCD，这些测量是最近几年从许多项目中获得的！5

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《EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV》|1993年|p.286-290|共5页
会议地点 San Diego CA(US)
作者
Richard C. Catura; Lockheed Palo Alto Research Lab.; Palo Alto; CA; USA; Lawrence Shing; Lockheed Palo Alto Research Lab.; Palo Alto; CA; USA.;
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正文语种 eng
中图分类无线电电子学、电信技术;
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入库时间 2022-08-26 14:31:25

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4. Soft x-ray and EUV efficiencies of CCDs [C] . Richard C. Catura, Lawrence Shing Conference on EUV, x-ray, and gamma-ray instrumentation for astronomy . 1993

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Soft x-ray and EUV efficiencies of CCDs

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