Characterisations of Laser Treated TiO_2-SiO_2 Thin Film by FT-IR Spectrometer

机译：FT-IR光谱仪表征激光处理的TiO_2-SiO_2薄膜

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FT-IR spectroscopy is used to resolve the changes in sol-gel coatings based on TiO-2 and SiO_2 during laser treatment. Bands at 3300 cm~(-1) and 906 cm~(-1) have been found to vary predictably with the state of the coating, allowing the potential for on-line monitoring to optimize the laser processing.

机译：傅立叶变换红外光谱用于解决激光处理过程中基于TiO-2和SiO_2的溶胶-凝胶涂层的变化。已发现3300 cm〜（-1）和906 cm〜（-1）的波段随涂层状态的变化可预测地变化，从而允许在线监控以优化激光加工的潜力。

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来源
《Eleventh Conference on Sensors and Their Applications Sep, 2001 London, UK》|2001年|p.403-407|共5页
会议地点 London(GB);London(GB);London(GB)
作者
J. Lee; C. Hunter; D. McStay;
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作者单位

The Optoelectronics Research Centre, School of Applied Science, The Robert Gordon University, Aberdeen, UK, AB 10 1FR;

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会议组织
原文格式 PDF
正文语种 eng
中图分类自动化技术、计算机技术;
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入库时间 2022-08-26 14:17:28

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Characterisations of Laser Treated TiO_2-SiO_2 Thin Film by FT-IR Spectrometer

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