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μ-Device Fabrication and Packaging below 300℃ utilizing Plasma-assisted Wafer-to-wafer Bonding

机译:利用等离子体辅助晶圆间键合技术在300℃以下进行μ器件制造和封装

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Wafer-to-wafer bonding techniques, such as anodic bonding or high temperature silicon direct fusion bonding, have been in development since the late 1960's and became key technologies for MEMS manufacturing. Plasma assisted wafer bonding is an emerging method offering several advantages over traditional bonding techniques. This technology was first discovered and patented in the early 1990's and has been used in SOI production for the past five years. Now plasma activation benefits are being used to enable 3D integration and advanced MEMS device fabrication and packaging. The main advantage of plasma assisted bonding is that high strength direct bonds between substrates, like Si, glass or polymers, can be achieved already below 300℃.
机译:自1960年代末以来,诸如阳极键合或高温硅直接熔融键合的晶圆对晶圆键合技术一直在发展,并已成为MEMS制造的关键技术。等离子辅助晶圆键合是一种新兴的方法,与传统键合技术相比具有许多优势。该技术在1990年代初首次被发现并申请了专利,并且在过去五年中已用于SOI生产。现在,等离子体激活的好处已被用于实现3D集成以及先进的MEMS器件制造和封装。等离子辅助键合的主要优点是,在低于300℃的温度下,可以实现基材之间的高强度直接键合,例如Si,玻璃或聚合物。

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