BASTION: Board and SoC test instrumentation for ageing and no failure found

摘要

This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail.