Cathodoluminescence and Electron Beam Induced Current techniques applied to the failure analysis of 980 nm pump lasers used in optical fiber amplification

摘要

In this work we analyze the possibilities of Electron Beam Induced Current and filtered Cathodoluminescence techniques as suitable tools for failure analysis of 980nm high power lasers. It is shown that a combination of both techniques together with a detailed band structure analysis allow to a much better understanding of the observed images and their signal formation.