首页> 外文会议>Conference on Materials and Devices for Optical and Wireless Communications, Oct 15-18, 2002, Shanghai, China >Transient and Static Thermal Behavior of High Power Single-Mode Semiconductor Lasers
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Transient and Static Thermal Behavior of High Power Single-Mode Semiconductor Lasers

机译:高功率单模半导体激光器的瞬态和静态热行为

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Transient and static thermal response of high power single-mode laser module has been simulated using finite element method (FEM). FEM modeling revealed the time constants of heat propagation in lateral direction and in vertical direction. The time constants calculated by FEM modeling in the microsecond scale and the sub-millisecond to millisecond scale were experimentally verified by a time-resolved far-field optical measurement and a transient forward-voltage measurement respectively. It is shown that the active region, semiconductor substrate and the solder-submount each contributes about 35%, 50% and 15% to the total static thermal resistance of the laser package.
机译:高功率单模激光模块的瞬态和静态热响应已使用有限元方法(FEM)进行了仿真。有限元建模揭示了横向和纵向热传播的时间常数。分别通过时间分辨的远场光学测量和瞬态正向电压测量,通过实验验证了通过FEM建模在微秒级和亚毫秒级到毫秒级范围内计算的时间常数。示出了有源区,半导体衬底和焊料基体各自对激光封装的总静态热阻贡献约35%,50%和15%。

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