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Optimized Approach for Microarray Scanning

机译:芯片扫描的优化方法

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Two common approaches to imaging fluorescent microarrays include CCD block scan imagers and laser/PMT-based scanners. CCD scanners afford high detector quantum efficiency, simultaneous illumination and detection of multiple pixels (parallelism) with concomitant opportunity to avoid dye saturation and difficult mechanical challenges -contributing to more reproducible measurements. CCD block scanners suffer from artifacts induced by out of focal-plane fluorescent particles - whose blurred image might not be analytically separable from target signal. Confocal scanners have excellent rejection of out-of-plane signals, and their small field of view allows for fine resolution with extremely high numerical apertures in the detection optics. Furthermore, they do not suffer from "stitching" artifacts commonly found in CCD systems that assemble a large image by tiling multiple blocks. Confocal systems scan continuously point by point, yet their design can be increasingly problematic as attempts are made to combine rapid scanning speeds, tight resolution, and large numerical apertures, where, for example, limitations in the depth of field can be especially worrisome. This paper explores some important principles governing SNR and susceptibility to artifacts for these strategies. Consideration is given to high dynamic range and high-sensitivity scanning approaches based upon CCD's that reap the aforementioned benefits of PMT-based confocal scanners.
机译:使荧光微阵列成像的两种常见方法包括CCD块扫描成像仪和基于激光/ PMT的扫描仪。 CCD扫描仪具有很高的检测器量子效率,同时照明和多个像素的检测(平行度),同时还提供了避免染料饱和和困难的机械挑战的机会-有助于更可重复的测量。 CCD块扫描仪受焦平面外的荧光粒子诱导而产生的伪影-模糊的图像可能无法与目标信号进行分析分离。共聚焦扫描仪具有出色的平面外信号抑制能力,其小视场可实现高分辨率,并在检测光学器件中具有极高的数值孔径。此外,它们不会遭受通常在CCD系统中发现的“拼接”伪影的影响,该CCD系统通过平铺多个块来组装大图像。共焦系统逐点连续扫描,但是当尝试结合快速扫描速度,严格的分辨率和较大的数值孔径时,它们的设计可能会变得越来越成问题,例如,在景深方面的限制尤其令人担忧。本文探讨了控制这些策略的信噪比和伪影敏感性的一些重要原则。考虑了基于CCD的高动态范围和高灵敏度扫描方法,这些方法可实现基于PMT的共聚焦扫描仪的上述优点。

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