首页> 外文会议>Conference on Advanced Optical Devices, Technologies, and Medical Applications Aug 19-22, 2002 Riga, Latvia >Influence of Free Carrier Heating on IR Light Detection in Narrow-Gap Semiconductors
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Influence of Free Carrier Heating on IR Light Detection in Narrow-Gap Semiconductors

机译:自由载流子加热对窄间隙半导体中红外光检测的影响

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Our study is concerned with peculiarities of intense CO_2 laser light detection in narrow-gap semiconductor p-n junctions. Samples of InSb, PbTe and HgCdTe were under investigation. We present experimental evidence of free carrier heating phenomenon in the semiconductors and its influence on photovoltaic signal. We show, that in particular cases, depending on laser light intensity and applied bias, the hot carrier photosignal of opposite polarity may predominate over the ordinary photovoltaic one.
机译:我们的研究与在窄间隙半导体p-n结中检测强CO_2激光的特性有关。正在研究InSb,PbTe和HgCdTe的样品。我们提供了半导体中自由载流子加热现象及其对光伏信号的影响的实验证据。我们表明,在特定情况下,取决于激光强度和所施加的偏压,相反极性的热载流子光信号可能会比普通的光伏载流子更占优势。

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