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XPS Studies on Composite ZrO_2-CeO_2 Thin Films Deposited on Metal Substrate by Sol-Gel

机译:Sol-Gel沉积在金属基体上的ZrO_2-CeO_2复合薄膜的XPS研究

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摘要

The influence of heat-treated temperature and the CeO_2 content on the chemical composition and the valence state of elements on surface of ZrO_2-CeO_2 thin films deposited on metal substrates has been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in the form of their respective stable state, such as Fe_2O_3, (Fe_(0.6)Cr_(0.4)O_3, ZrO_2, CeO_2, when heat treated at 600℃ and 700℃ for 2h respectively; with the increase of heat-treated temperature, the area of oxygen with O_(1s) peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with O_(1s) peak corresponding to value of bonding energy 531.7ev decreases.
机译:利用X射线光电子能谱研究了热处理温度和CeO_2含量对沉积在金属基底上的ZrO_2-CeO_2薄膜表面化学元素和元素价态的影响。结果表明:Fe,Cr,Zr,Ce元素在600℃,700℃热处理时分别以Fe_2O_3,(Fe_(0.6)Cr_(0.4)O_3,ZrO_2,CeO_2等稳定状态存在。分别保持在2℃;随着热处理温度的升高,与键合能值529.28ev相对应的O_(1s)峰的氧面积增加,但与键合值相对应的O_(1s)峰的氧面积增加。能量531.7ev降低。

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