State Key Laboratory of Wide-Bandgap Semiconductor Power Electronic Devices Nanjing Electronic Devices Institute Nanjing China;
State Key Laboratory of Wide-Bandgap Semiconductor Power Electronic Devices Nanjing Electronic Devices Institute Nanjing C;
Silicon carbide; MOSFET; Electric fields; Current density; Temperature measurement; JFETs; Logic gates;
机译:4H-SiC DMOSFET功率晶体管的仿真和优化
机译:6500V 4H-SiC JBS二极管的非均匀间距多浮面圆环的设计和制造
机译:感应开关下4H-SIC DMOSFET结构的基于物理的仿真
机译:6500V 4H-SIC POWER DMOSFET的仿真,制造和表征
机译:基于数值模拟的脉冲功率应用4H-SiC光电导开关的评估。
机译:高效率保护的4H-SIC动力装置CFM-JTE的表征和制造及JTE剂量耐受窗口
机译:800 V 4H-SIC POWER DMOSFET结构优化的仿真研究