Applications of Aberration-Corrected Low-Energy Electron Microscopy for Metal Surfaces

摘要

Low energy electron microscopy and photoemission electron microscopy (LEEM/PEEM), as powerful in-situ surface-sensitive electron microscopy, find wide applications in surface physics, chemistry and catalysis. The high reflectivity of incident low-energy electrons (0-100 eV), allows it to image the surface structures in the topmost few atomic layers within less than one second, while the sample can be heated up to 1200 °C in real time which is potentially very useful in metallurgy and materials fields. A unique three-prism aberration correction (ac-) LEEM was commissioned successfully in Chongqing University, with a lateral resolution below 2 nm. A multiple gas source in the ac-LEEM system was installed as well, which allowed us to observe chemical reactions of nanoscale mineral powders on metallic substrates. In this paper, the latest results on the applications of this three-prism ac-LEEM on oxidation and reduction processes on copper and iron polycrystalline surfaces are demonstrated.