Morphology and optical properties of thin CdTe films

摘要

Experimental research in deposition of thin CdTe films was carried out using the resistive dynamic vacuum evaporation method. While forming thin CdTe films, temperature parameters of a substrate varied. Parameters of obtained CdTe films were investigated using Raman spectroscopy, scanning profilometry and scanning electron microscopy. The measured results showed high quality of thin CdTe films deposited on the substrate at temperature of 300℃ and 450℃.