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GROWTH OF ORIENTED SnO_2 THIN FILMS FROM ORGANOTIN COMPOUNDS ON GLASS SUBSTRATES BY SPRAY PYROLYSIS

机译:喷雾热解法从有机锡化合物在玻璃基质上生长定向的SnO_2薄膜

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摘要

Tin(IV) oxide (SnO_2) is an oxygen-defect type semiconductor with a wide band gap and a large mobility. It is transparent in the visible region, and reflective in the infrared region. Thus, SnO_2 thin films have been used as transparent electrodes in sophisticated electrochromic, electroluminescent, and photoconductive devices. Recently, it has been also reported that gas sensitivity is high for (110) oriented SnO_2 thin flms and a large electrical conductivity is obtained in (200) oriented SnO_2 thin films.rnChemical techniques, including spray pyrolysis using simple apparatus with good productivity, for the preparation of thin films facilitate the design of materials on a molecular level. The influence of preparation conditions on the physical properties of sprayed SnO_2 thin films has been studied extensively; in contrast, the influence on film formation seldom has been examined in detail. Although source compounds play an important role in controlling the structure and morphology of thin films under spray pyrolysis, the effect of those compounds on the growth of thin films has not yet been investigated extensively. In the case of SnO_2 thin films also, other compounds except for tin(IV) chloride1 have not been examined sufficiently.
机译:氧化锡(IV)(SnO_2)是一种带隙宽且迁移率大的氧缺陷型半导体。它在可见光区域是透明的,在红外光区域是反射的。因此,SnO_2薄膜已被用作复杂的电致变色,电致发光和光电导设备中的透明电极。最近,也有报道指出,(110)取向的SnO_2薄膜的气敏性高,在(200)取向的SnO_2薄膜中获得了较大的电导率。化学技术,包括使用简单的装置以高生产率进行喷雾热解。薄膜的制备有助于在分子水平上设计材料。制备条件对喷涂SnO_2薄膜物理性能的影响已得到广泛研究。相反,很少详细研究对成膜的影响。尽管源化合物在喷雾热解过程中对控制薄膜的结构和形态起着重要作用,但这些化合物对薄膜生长的影响尚未得到广泛研究。同样在SnO_2薄膜的情况下,除氯化锡(IV)1以外的其他化合物也未得到充分研究。

著录项

  • 来源
  • 会议地点 Berkeley CA(US)
  • 作者单位

    Dept. Mater. Sci. Tech., Shizuoka University, Johoku, Hamamatsu 432, Japan;

    Grad. Schl Electron. Sci. Tech.,Shizuoka University, Johoku, Hamamatsu 432, Japan;

    Grad. Schl Electron. Sci. Tech.,Shizuoka University, Johoku, Hamamatsu 432, Japan;

    Res.Inst. Electron., Shizuoka University, Johoku, Hamamatsu 432, Japan;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 TQ174.01;
  • 关键词

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