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Experimental Research on Changing Al-15 Si Alloy Solidification Structure by Electric Pulse (EP) Treating

机译:电脉冲处理改变Al-15%Si合金凝固组织的实验研究

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Experimental Research on changing Al-15%Si alloy solidification structure by electric pulse (EP) treating had been carried out. Al-15%Si molten alloy, melted with Al (99.95%) and Si (99.96%), are treated by EP in different condition, and poured into metal mold to make metallographic specimen and DSC specimen. Results of metallographic analyzing indicated that, microstructure of being treated by EP is different from untreated (original) specimen obviously. After be treated, changing of primary silicon in solidification structure is in alternate change from presenting (original specimen) to disappear (treated 30 Sec.) and then appearing (treated 60 Sec.). Accompany with the changing of primary silicon, eutectic phase is changed too. When primary silicon is disappeared, eutectic silicon is granular shape and quiet refined; when primary silicon is appeared, eutectic silicon present needle and granular shape in different size, and solidification structure is similar to original specimen. After be treated, solidification microstructure of different specimens is refined in different grade. Cooling curves of different specimens by DSC analyzing are changed apparently. On the cooling curve of untreated specimen, there is apparent inflection point of primary silicon precipitating. On the cooling curve of being treated 30 sec. specimen, there is not inflection point of primary silicon precipitating. At same time, on cooling curve of DSC of specimens being treated, degree of supercooling is increased and the freezing range is decreased.
机译:进行了通过电脉冲处理改变Al-15%Si合金凝固组织的实验研究。将Al-15%Si熔融合金与Al(99.95%)和Si(99.96%)熔融,在不同条件下进行EP处理,然后倒入金属模具中,制成金相试样和DSC试样。金相分析结果表明,经EP处理的显微组织与未经处理的(原始)试样明显不同。经过处理后,凝固组织中原始硅的变化是交替出现的(从呈现(原始样品)到消失(处理30秒)然后出现(处理60秒)。随着原硅的变化,共晶相也发生变化。当初级硅消失时,低共熔硅呈颗粒状并被安静地提纯。当初生硅出现时,共晶硅呈现出不同大小的针状和颗粒状,凝固组织与原始试样相似。处理后,对不同试样的凝固组织进行不同等级的细化。通过DSC分析,不同样品的冷却曲线明显改变。在未经处理的试样的冷却曲线上,有明显的初生硅沉淀拐点。在30秒的冷却曲线上。标本中没有初生硅沉淀的拐点。同时,在待处理试样的DSC冷却曲线上,过冷度增加,冻结范围减小。

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