Characteristic impedance measurements of a WR-10 waveguide sample with a Dispersive Fourier Transform Spectrometer

摘要

An alternative to the standard network analyser technique for measuring waveguide characteristic impedance is reported. The technique is well suited for measuring waveguides in the terahertz range. DFTS is performed on waveguide samples of different length with a quasi-optical reflectometer. Measurements of phase of the reflectance signature can be used to calculate the characteristic impedance of the waveguide. Experimental results have been found to agree well with theoretical calculations.