首页> 外文会议>AMA conference 2013 >Development and Characterization of a High Precision Vibratory MEMS Gyroscope System with Low-Noise Integrated Readout and Control Electronics
【24h】

Development and Characterization of a High Precision Vibratory MEMS Gyroscope System with Low-Noise Integrated Readout and Control Electronics

机译:具有低噪声集成读出和控制电子器件的高精度振动MEMS陀螺仪系统的开发和特性

获取原文
获取原文并翻译 | 示例

摘要

In this work a MEMS vibratory gyroscope fabricated with a high aspect ratio technology (25:1) and high quality factorrn(Q> 90,000) in combination with an ASIC for low noise integrated readout (0.4 μV/ rtHz), control and compensationrnelectronics will be introduced. The development of the sensor system focuses on a very symmetric design of thernmechanical element as well as of the electronics excitation and detection to be able to detect capacitance changes ofrnfew aF. The angular rate sensitivity is 0.7 mV/ (°/s) at the first analog stage. Measurement results of the start-uprnbehavior drive amplitude and frequency stability as well as angular rates will be shown.
机译:在这项工作中,将采用高纵横比技术(25:1)和高品质因数(Q> 90,000)制成的MEMS振动陀螺仪与用于低噪声集成读数(0.4μV/ rtHz),控制和补偿电子的ASIC结合使用。介绍。传感器系统的开发侧重于机械元件以及电子激励和检测的非常对称的设计,以便能够检测出少量aF的电容变化。在第一模拟阶段,角速率灵敏度为0.7 mV /(°/ s)。将显示启动行为驱动幅度和频率稳定性以及角速率的测量结果。

著录项

  • 来源
    《AMA conference 2013》|2013年|736-738|共3页
  • 会议地点 Nurnberg(DE)
  • 作者单位

    EDC Electronic Design Chemnitz GmbH, Technologie-Campus 1, 09126 Chemnitz, daniel.koehler@ed-chemnitz.de;

    Chemnitz University of Technolog , Center for Microtechnologies;

    Fraunhofer ENAS Chemnitz;

    EDC Electronic Design Chemnitz GmbH, Technologie-Campus 1, 09126 Chemnitz;

    EDC Electronic Design Chemnitz GmbH, Technologie-Campus 1, 09126 Chemnitz;

    Fraunhofer ENAS Chemnitz;

    EDC Electronic Design Chemnitz GmbH, Technologie-Campus 1, 09126 Chemnitz;

    EDC Electronic Design Chemnitz GmbH, Technologie-Campus 1, 09126 Chemnitz;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    MEMS; Gyroscope; ASIC; readout electronics; high precision;

    机译:MEMS;陀螺仪; ASIC;读出电子设备;高精度;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号