IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
TEL Technology Center, America, LLC, 255 Fuller Road, Suite 244, Albany, NY 12203;
TEL Technology Center, America, LLC, 255 Fuller Road, Suite 244, Albany, NY 12203;
TEL Technology Center, America, LLC, 255 Fuller Road, Suite 244, Albany, NY 12203;
IBM T. J. Watson Research Center, 1101 Kitchawan Rd., Route 134, Yorktown Heights, NY 10598;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
IBM SRDC, Hoewell Junction, NY 12533;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
IBM T. J. Watson Research Center, 1101 Kitchawan Rd., Route 134, Yorktown Heights, NY 10598;
GLOBALFOUNDRIES, 257 Fuller Road, Albany NY12203;
GLOBALFOUNDRIES, 257 Fuller Road, Albany NY12203;
GLOBALFOUNDRIES, 257 Fuller Road, Albany NY12203;
IBM Almaden Research Center, 650 Harry Rd., San Jose, CA 95120;
IBM Almaden Research Center, 650 Harry Rd., San Jose, CA 95120;
TEL Technology Center, America, LLC, 255 Fuller Road, Suite 244, Albany, NY 12203;
TEL Technology Center, America, LLC, 255 Fuller Road, Suite 244, Albany, NY 12203;
Tokyo Electron America, Inc. 2400 Grove Boulevard, Austin, TX 78741;
IBM Albany NanoTech, 257 Fuller Road, Albany NY 12203;
Directed self-assembly; DSA; block copolymer; BCP; process window; SOI; device; short channel effect;
机译:通过单光子和双光子激光测试技术直接比较SOI器件中的电荷收集
机译:具有重新填充的电隔离沟槽的高纵横比SOI MEMS器件的制造挑战和测试结构
机译:通过建筑电气安装认证测试安全开关设备的方向
机译:在大功率阻尼正弦波辐射下测试电启动设备(EID)的电磁脆弱性
机译:微流控设备中嵌段共聚物的流控溶液自组装。
机译:随机离散掺杂剂引起的具有固定顶鳍宽度的16nm栅极梯形体FinFET器件的电特性波动
机译:经济和货币事务及产业政策委员会关于委员会关于修订指令87/404 / EEC(简单压力容器),88/378 / EEC(玩具安全),89/106 / EEC(建筑产品),89/336 / EEC(电磁兼容性),89/392 / EEC(机械),89/686 / EEC(个人防护装备),90/384 / EEC(非自动称重仪器),90/380 / EEC(有源植入式医疗设备),90/396 / EEC(燃烧气体燃料的设备),91/263 / EEC(电信终端设备),92/42 / EEC(用液体或气体燃料燃烧的新型热水锅炉)委员会关于修改理事会1990年12月13日关于合格评定程序各阶段模块的决定的委员会决定提案,以及73/23 / EEC(设计用于某些电压限制内的电气设备)(90/683) / EEC),补充有关粘贴和使用安排的规定EC符合性标记(COm(92)0499 fin。 - C3-0038 / 93,C3-0039 / 93-sYN 336 a + B)。会议文件1993年,文件a3-0084 / 93,1993年3月8日
机译:从单光子和双光子激光测试技术直接比较sOI器件中的电荷收集