Testing the electromagnetic vulnerability of electrically initiated devices (EID) at high-power damped-sinusoid irradiation

摘要

This paper proposes a test procedure to determine safety distance of systems containing EID in a pulsed electromagnetic environment (EME). The test procedure is based on a radiative emission measurement in order to capture maximum EMC generated EID bridgewire temperature. The paper describes the test setup, the dynamic measurement requirements, the calibration and test routine and the derivation of the EID safety distance for pulsed EME. As an example, the safety distance has been determined experimentally for a generic EID test setup at high power damped-sinusoid (DS) irradiation.