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Proposal for a Universal Test Mirror for Characterization of Slope Measuring Instruments

机译:关于表征斜度测量仪器的通用测试镜的建议

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The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II brought to a focus the need for high performance synchrotron optics with unprecedented tolerances for slope error and micro roughness. Proposed beam lines at Free Electron Lasers (FEL) require optical elements up to a length of one meter, characterized by a residual slope error in the range of 0.1 μrad (rms), and rms values of 0.1 nm for micro roughness. These optical elements must be inspected by highly accurate measuring instruments, providing a measurement uncertainty lower than the specified accuracy of the surface under test. It is essential that metrology devices in use at synchrotron laboratories be precisely characterized and calibrated to achieve this target. In this paper we discuss a proposal for a Universal Test Mirror (UTM) as a realization of a high performance calibration instrument. The instrument would provide an ideal calibration surface to replicate a redundant surface under test of redundant figure. The application of a sophisticated calibration instrument will allow the elimination of the majority of the systematic error from the error budget of an individual measurement of a particular optical element. We present the limitations of existing methods, initial UTM design considerations, possible calibration algorithms, and an estimation of the expected accuracy.
机译:第三代光源(如高级光源(ALS)或BESSY II)的发展引起了对高性能同步加速器光学器件的关注,该光学器件具有前所未有的斜率误差和微粗糙度容差。自由电子激光器(FEL)上建议的光束线要求光学元件的长度不超过一米,其特征在于残留斜率误差在0.1μrad(rms)范围内,微粗糙度的均方根值为0.1 nm。这些光学元件必须由高度精确的测量仪器进行检查,其测量不确定度低于被测表面的规定精度。必须对同步加速器实验室中使用的计量设备进行精确表征和校准,以实现此目标。在本文中,我们讨论了通用测试镜(UTM)的建议,以实现高性能校准仪器。该仪器将提供理想的校准表面,以在冗余图形的测试下复制冗余表面。精密校准仪器的应用将可以消除特定光学元件单独测量的误差预算中的大部分系统误差。我们介绍了现有方法的局限性,最初的UTM设计考虑因素,可能的校准算法以及对预期精度的估计。

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