Institute of Electrical Engineering, SAS, Dubravska cesta 9, 841 04 Bratislava, Slovakia;
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan;
CNR IMEM Institute, Viale Usberti, 37/A, Parma, 43124, Italy;
Institute of Physics, SAS, Debravska cesta 9, 845 11 Bratislava, Slovakia;
Institute of Physics, SAS, Debravska cesta 9, 845 11 Bratislava, Slovakia;
Institute of Electrical Engineering, SAS, Dubravska cesta 9, 841 04 Bratislava, Slovakia;
Institute of Electrical Engineering, SAS, Dubravska cesta 9, 841 04 Bratislava, Slovakia;
A. Dubcek University of Trencin, Studentska 2, SK-911 50 Trencin, Slovakia;
CEITEC, Masaryk University, Kotlarska 2, CZ-61137 Brno, Czech Republic;
X-ray metrology and imaging; Ge; GeSi; and Cu monochromators; surface processing and quality; surface inhomogeneities in V-channel monochromators; surface texture;
机译:用于高级X射线成像和计量应用的高不对称角度X射线晶体单色仪的计算和表面质量测量
机译:利用梁压缩通道切割单色器的潜力,用于实验室高分辨率小角X射线散射实验
机译:将可变夹角光栅单色仪与软X射线FEL光源的特性匹配,以实现受控的时间拉伸
机译:较高不对称角X射线单色器中的过程诱导的不均匀性
机译:氧化铝/环氧纳米复合材料的机械性能:加工的影响和加工引起的不均匀性。
机译:小角度X射线散射揭示的生理条件下GroEL-GroES配合物的不对称性
机译:用于高级X射线成像和计量应用的高不对称角度X射线晶体单色仪的计算和表面质量测量
机译:使用全反射准直X射线。第III部分 - 用于研究小角度X射线散射的高速单色仪