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Buried heterostructure formation processes for high-performance devices

机译:高性能器件的掩埋异质结构形成工艺

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Abstract: New AlGaAs buried heterostructure (BH) formation processes based on low temperature (T $LS 600$DGR@C) in-situ mesa melt-etching and liquid phase epitaxial (LPE) regrowth have been studied and applied to the fabrication of BH laser diodes. It was shown that the BH formation process on Al$-x$/Ga$-1$MIN@x$/As laser structures with x $EQ 0.2...0.5 of cladding layers and masking stripes oriented along $LB@01$OBAR1$RB or $LB@0$OBAR11$RB on (100) planes depends on melt-etching rate anisotropy, while in a similar process for x $GRT 0.6, or masking stripe orientations other than $LB@01$OBAR1$RB or $LB@0$OBAR11$RB the most important factors is the melt-etching material selectivity. Difficult AlGaAs nucleation on A-type planes is a distinct feature of LPE regrowth at temperatures lower than 600$DGR@C. Low temperature melt-etching and regrowth produced single mode AlGaAs BH laser diodes emitting at 800 nm with the maximum optical power of 120 mW at 106 mA. !17
机译:摘要:研究了基于低温(T $ LS 600 $ DGR @ C)原位台面熔蚀和液相外延(LPE)再生长的新AlGaAs掩埋异质结构(BH)形成工艺并将其应用于BH的制造激光二极管。结果表明在Al $ -x $ / Ga $ -1 $ MIN @ x $ / As激光器结构上具有x $ EQ 0.2 ... 0.5的包层和沿$ LB @ 01 $取向的掩膜条纹的BH形成过程(100)平面上的OBAR1 $ RB或$ LB @ 0 $ OBAR11 $ RB取决于熔体蚀刻速率各向异性,而对于x $ GRT 0.6,则采用类似的工艺,或者掩盖除$ LB @ 01 $ OBAR1 $ RB以外的条纹方向或$ LB @ 0 $ OBAR11 $ RB最重要的因素是熔融蚀刻材料的选择性。 AlGaAs在A型平面上难以成核是LPE在低于600 $ DGR @ C的温度下再生的显着特征。低温熔融蚀刻和再生长产生的单模AlGaAs BH激光二极管在800 nm处发射,在106 mA时的最大光功率为120 mW。 !17

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