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Advanced Mask Aligner Lithography (AMALITH)

机译:先进的掩模对准仪光刻(AMALITH)

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摘要

In this paper we show that it is possible using optical photolithography to obtain micron and submicron features for periodic structures in non-contact using the Talbot effect. In order for this effect to work it is important to have good control of the illumination light and here we show that the MO Exposure Optics (MOEO) developed by SUSS MicroOptics provides uniform and well collimated illumination light suitable for Talbot lithography. The MOEO can easily be incorporated into a standard mask aligner. Here we show 1 μm and 0.65 μm diameter holes in a hexagonal array in photoresist made in large-gap proximity printing.
机译:在本文中,我们表明使用光学光刻技术可以通过Talbot效应获得非接触式周期性结构的微米和亚微米特征。为了使这种效果发挥作用,重要的是要对照明光进行良好的控制,在这里我们表明,SUSS MicroOptics开发的MO曝光光学(MOEO)提供适用于Talbot光刻的均匀且准直的照明光。 MOEO可以很容易地并入标准的掩模对准器中。在这里,我们在大间隙邻近印刷中制作的光刻胶中,在六角形阵列中显示了直径为1μm和0.65μm的孔。

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  • 来源
  • 会议地点 San Francisco CA(US)
  • 作者单位

    CSEM Swiss Centre for Electronics and Microtechnology SA, Rue Jaquet-Droz 1, CH-2002 Neuchatel, Switzerland;

    CSEM Swiss Centre for Electronics and Microtechnology SA, Rue Jaquet-Droz 1, CH-2002 Neuchatel, Switzerland;

    SUSS MicroOptics, Rouges-Terres 61, Hauterive, Switzerland;

    CSEM Swiss Centre for Electronics and Microtechnology SA, Rue Jaquet-Droz 1, CH-2002 Neuchatel, Switzerland;

    SUSS MicroOptics, Rouges-Terres 61, Hauterive, Switzerland;

    SUSS MicroOptics, Rouges-Terres 61, Hauterive, Switzerland;

    CSEM Swiss Centre for Electronics and Microtechnology SA, Rue Jaquet-Droz 1, CH-2002 Neuchatel, Switzerland;

    SUSS MicroOptics, Rouges-Terres 61, Hauterive, Switzerland;

    CSEM Swiss Centre for Electronics and Microtechnology SA, Rue Jaquet-Droz 1, CH-2002 Neuchatel, Switzerland;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Talbot Lithography; Submicron Lithography;

    机译:Talbot光刻;亚微米光刻;

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